$4f$ electron temperature driven ultrafast electron localization (2024)

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4f electron temperature driven ultrafast electron localization

Kohei Yamagami, Hiroki Ueda, Urs Staub, Yujun Zhang, Kohei Yamamoto, Sang Han Park, Soonnam Kwon, Akihiro Mitsuda, Hirofumi Wada, Takayuki Uozumi, Kojiro Mimura, and Hiroki Wadati
Phys. Rev. Research 6, 023099 – Published 29 April 2024
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$4f$ electron temperature driven ultrafast electron localization (1)

Abstract
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Article Text
  • INTRODUCTION
  • EXPERIMENTAL CONDITIONS
  • Eu VALENCE CHANGES IN EQUILIBRIUM AND…
  • NONEQUILIBRIUM 4f ELECTRONIC STRUCTURE…
  • DISCUSSION: ULTRAFAST 4f LOCALIZATION…
  • CONCLUSION
  • ACKNOWLEDGMENTS
  • Supplemental Material
    References

    $4f$ electron temperature driven ultrafast electron localization (2)

    Abstract

    Valence transitions in strongly correlated electron systems are caused by orbital hybridization and Coulomb interactions between localized and delocalized electrons. The transition can be triggered by changes in the electronic structure and is sensitive to temperature variations, applications of magnetic fields, and physical or chemical pressure. Launching the transition by photoelectric fields can directly excite the electronic states and thus provides an ideal platform to study the correlation among electrons on ultrafast timescales. The EuNi2(Si0.21Ge0.79)2 mixed-valence metal is an ideal material to investigate the valence transition of the Eu ions via the amplified orbital hybridization by the photoelectric field on subpicosecond timescales. A direct view on the 4f electron occupancy of the Eu ions is required to understand the microscopic origin of the transition. Here we probe the 4f electron states of EuNi2(Si0.21Ge0.79)2 at the sub-ps timescale after photoexcitation by x-ray absorption spectroscopy across the Eu M5-absorption edge. The observed spectral changes due to the excitation indicate a population change of total angular momentum multiplet states J = 0, 1, 2, and 3 of Eu3+ and the Eu2+J = 7/2 multiplet state caused by an increase in 4f electron temperature that results in a 4f localization process. This electronic temperature increases combined with fluence-dependent screening accounts for the strongly nonlinear effective valence change. The data allow us to extract a time-dependent determination of an effective temperature of the 4f shell, which is also of great relevance in the understanding of metallic systems' properties, such as the ultrafast demagnetization of ferromagnetic rare-earth intermetallic and their all-optical magnetization switching. In addition, our results elucidate the energetics of charge fluctuations in valence-mixed electronic systems, which provide enriched knowledge regarding the role of valence transitions and orbital hybridization for quantum critical phenomena.

    • $4f$ electron temperature driven ultrafast electron localization (3)
    • $4f$ electron temperature driven ultrafast electron localization (4)
    • $4f$ electron temperature driven ultrafast electron localization (5)
    • $4f$ electron temperature driven ultrafast electron localization (6)
    • Received 27 October 2023
    • Revised 9 February 2024
    • Accepted 4 March 2024

    DOI:https://doi.org/10.1103/PhysRevResearch.6.023099

    $4f$ electron temperature driven ultrafast electron localization (7)

    Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article's title, journal citation, and DOI.

    Published by the American Physical Society

    Physics Subject Headings (PhySH)

    1. Research Areas

    Electronic structure

    1. Physical Systems

    Strongly correlated systems

    1. Techniques

    Ultrafast femtosecond pump probeUltrafast pump-probe spectroscopyX-ray absorption spectroscopy

    Condensed Matter, Materials & Applied PhysicsNonlinear Dynamics

    Authors & Affiliations

    Kohei Yamagami1,*, Hiroki Ueda2, Urs Staub3, Yujun Zhang4,†, Kohei Yamamoto5,‡, Sang Han Park6, Soonnam Kwon6, Akihiro Mitsuda7, Hirofumi Wada7, Takayuki Uozumi8, Kojiro Mimura8, and Hiroki Wadati4,9

    • 1Institute for Solid State Physics, The University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa, Chiba 277-8581, Japan
    • 2SwissFEL, Paul Scherrer Institut, 5232 Villigen PSI, Switzerland,
    • 3Swiss Light Source, Paul Scherrer Institut, 5232 Villigen PSI, Switzerland
    • 4Department of Material Science, Graduate School of Science, University of Hyogo, 3-2-1 Kouto, Kamigori-cho, Ako-gun, Hyogo 678-1297, Japan
    • 5Institute for Molecular Science, Myodaiji, Okazaki, Aichi 444-8585, Japan
    • 6PAL-XFEL, Pohang Accelerator Laboratory, 77 Cheongam-Ro, Nam-Gu, Pohang, Gyeongbuk 37673, Republic of Korea
    • 7Department of Physics, Kyushu University, Motooka 744, Nishi-ku f*ckuoka 819-0395, Japan
    • 8Department of Physics and Electronics, Osaka Metropolitan University, 1-1 Gakuen-cho, Naka-ku, Sakai, Osaka 599-8531, Japan
    • 9Institute of Laser Engineering, Osaka University, 2–6 Yamadaoka, Suita, Osaka 565-0871, Japan
    • *Present address: Japan Synchrotron Radiation Research Institute, 1-1-1, Sayo-cho, Sayo-gun, Hyogo 679-5198, Japan.
    • Present address: Institute of High Energy Physics, Chinese Academy of Sciences, Yuquan Road 19B, Shijingshan District, Beijing 100049, China.
    • Present address: National Institutes for Quantum Science and Technology, 6-6-11-901 Aramaki, Sendai Aoba-ku, Miyagi 980-8579, Japan.

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    Issue

    Vol. 6, Iss. 2 — April - June 2024

    Subject Areas
    • Condensed Matter Physics
    • Materials Science
    • Strongly Correlated Materials
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      Figure 1

      (a) Schematic of the electronic bands including a core hole of the XAS probe, modifications of the 4f states upon laser excitation (red arrows), and 3d5/24f core-level absorption (M5-edge) process (purple arrows). (b) The experimental setup of the tr-XAS. (c) XAS around the Eu M5 edge at 300 and 80 K (upper spectra) crossing the mixed-valence transition temperature. The middle spectra are the atomic multiplet calculations broadened to match experimental data. The calculated spectral components of the Eu2+ and Eu3+ free ion spectra are shown at the bottom without convolution with instrumental resolution broadening.

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      Figure 2

      (a) The Eu M5-edge tr-XAS spectra at 80 K under low (0.12 mJ/cm2, blue) and high fluences (5.0 mJ/cm2, red) with (Δt=0.5ps) and without (black, taken at Δt=5.0ps) laser excitation at early times. (b) XAS spectral intensity changes (ΔI) at 0.5 ps. In panels (a) and (b), the vertical dashed lines denote the photon energies, labeled as E1 = 1128.5 eV, E2 = 1131 eV, and E3 = 1132.5 eV, which are discussed in the main text. (c) Ultrafast ΔI change as a function of Δt for selected fluences at 80 K of the Eu2+ peak (E1). The colored solid lines are best fits to two exponential functions. (d),(e) Laser fluence dependence of the amplitude Ai and the recovery time τi (i=1, 2). The solid lines guide the eyes.

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      Figure 3

      (a) The atomic multiplet calculations of each J state. (b) Energy level of the ground and excited states for Eu2+ and Eu3+ free ions. Eex is the energy of Eu2+J = 7/2 state from the Fermi level, which is at the Eu3+J = 0 state. (c) The experimental and calculated Eu M5-edge XAS spectra at 80 K, 0.12 mJ/cm2, and Δt=0.5 ps. Black dashed curves indicate data without laser excitation taken at Δt=5.0ps (equilibrium). The spectral difference from the equilibrium data is shown in the bottom panel.

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      Figure 4

      The M5-edge XAS and ΔI spectra for selected fluences at 80 K and Δt = 0.5 ps, together with equilibrium data taken at Δt=5.0 ps. (b) The calculated XAS and their difference from equilibrium spectrum reproduces well the experimental results. (c) Calculated Eu2+ and Eu3+ populations at different Eex as a function of T*. The vertical black dashed line with circle marks approximately the equilibrium case (80 K). (d) The T*Eex mapping of the Eu valence. The circles denote the obtained values for each fluence from spectral fits based on the ICF model. The curved dashed line corresponds to the Eu valence of 2.71. Horizontal line cuts at fixed Eex=24, 48, 96, 192 meV, denoting nonlinear Eu valence change as a function of T*, are shown in Fig. S7.

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